Campbell TDR Manuál Strana 1

TDR Probes CS605, CS610, CS630, CS635, CS640, CS645Revision: 9/13 Copyright © 2006-2013Campbell Scientific, Inc.

TDR Probes CS605, CS610, CS630, CS635, CS640, CS645 Calculation, with all cabling from TDR100 to probe in place will compensate for the cable losses.

TDR Probes CS605, CS610, CS630, CS635, CS640, CS645 datalogger algorithm to analyze the waveform are shifted by the cable losses resulting in error.

TDR Probes CS605, CS610, CS630, CS635, CS640, CS645 can affect the accuracy and resolution of water content measurements. FIGURE 7-2 presents a serie

TDR Probes CS605, CS610, CS630, CS635, CS640, CS645 The combined effect of long cable runs and high soil electrical conductivity must be considered wh

TDR Probes CS605, CS610, CS630, CS635, CS640, CS645 8

Appendix A. Discussion of TDR Probe Offset and a Simple Laboratory Method for Calculation A.1 Discussion of Probe Offset Probe offset accounts for

Appendix A. Discussion of TDR Probe Offset and a Simple Laboratory Method for Calculation A.2 The Compounding Effect of Signal Attenuation in Connec

Appendix A. Discussion of TDR Probe Offset and a Simple Laboratory Method for Calculation A.3 Method for Calculating Probe Offset Using Information

Appendix A. Discussion of TDR Probe Offset and a Simple Laboratory Method for Calculation 4. Enter Terminal Mode using Options/Terminal Emulator. 5.

Appendix A. Discussion of TDR Probe Offset and a Simple Laboratory Method for Calculation thWindowLeng•1datapointsend:endindexdistance−= 65.0startdi

Appendix A. Discussion of TDR Probe Offset and a Simple Laboratory Method for Calculation A-6 TABLE A-1. Dielectric permittivity values for range of

Appendix B. Correcting Electrical Conductivity Measurements for System Losses TDR system cabling and multiplexers introduce losses of the applied an

Appendix B. Correcting Electrical Conductivity Measurements for System Losses electrical conductivity. Kp is calculated as the ratio of electrical c

Appendix B. Correcting Electrical Conductivity Measurements for System Losses The temperature effect is described by: ()()25T•02.01•ECEC25T−+= [B4]

Appendix B. Correcting Electrical Conductivity Measurements for System Losses B.2.4 CR1000 Program for Collecting ρopen and ρshorted Values 'Th

Appendix B. Correcting Electrical Conductivity Measurements for System Losses 'setting SDMports high will configure control ports 1 thru 3 to al

Appendix B. Correcting Electrical Conductivity Measurements for System Losses B-6

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Table of Contents PDF viewers: These page numbers refer to the printed version of this document. Use the PDF reader bookmarks tab for links to spec

Table of Contents ii B. Correcting Electrical Conductivity Measurements for System Losses...B-1 B.1 Description of Method...

TDR Probes CS605, CS610, CS630, CS635, CS640, CS645 1. Introduction This document presents descriptions and instructions for Campbell Scientific Tim

TDR Probes CS605, CS610, CS630, CS635, CS640, CS645 as a change in probe impedance which affects the shape of the reflection. The shape of the reflec

TDR Probes CS605, CS610, CS630, CS635, CS640, CS645 5.3 Electromagnetic Compatibility All TDR probes are compliant with performance criteria availa